Daily Archives: 2-April-2016

MTBF, Failure Rate, and Annualized Failure Rate Again

I just had another meeting where folks thought that specifications for Annualized Failure Rate (AFR), failure rate (λ), and Mean Time Between Failures (MTBF) were three different things – they are mathematically equivalent. I have given up writing the formulas down as a way to explain the concept. Maybe a graphic will illustrate the relationship better? I have tried this approach before – the most successful was about component temperatures. That graphic has saved me hours. Continue reading

 
Posted in Electronics | 2 Comments